Advanced AFM Techniques for Gene Expression Profiling

UC Case No. 2009-727

 

SUMMARY:

UCLA researchers at the California Nano Systems Institute have developed a platform for automated measurement of gene transcription using AFM.

 

BACKGROUND:

Changes in gene transcription is an important indicator of cellular health and metabolism. Therefore, it is routinely measured in biomedical research and drug discovery studies and is being increasingly used in clinics for disease detection. Atomic force microscopy (AFM) is a powerful technique that can be used for measuring gene transcription changes in biological samples. However, it cannot measure transcription from minute samples and is currently not amenable for high-throughput measurements.

 

INNOVATION:

UCLA researchers have developed a platform for processing AFM images to accurately determine gene transcription profiles.  The method is fully automated and does not have user bias. It is also compatible with high-throughput measurements. They have shown its efficacy in measuring mixtures of 15 distinct DNA fragments of varying lengths (66-588 nm) with low error frequency of 0.28%-3.24%.

 

POTENTIAL APPLICATIONS:

  • Measuring gene expression in minute samples
  • Tissue analysis
  • Imaging transcription in single cells

 

ADVANTAGES:

  • Requires minute samples
  • Amenable with high-throughput processing
  • Low error frequency

 

DEVELOPMENT-TO-DATE: 

Prototype developed and tested in lab

 

 

 

 

Patent Information:
For More Information:
Megha Patel
Business Development Officer
Megha.patel@tdg.ucla.edu
Inventors:
Jason Reed
Bhubaneswar Mishra
Andrew Sundstrom