2016-175 PIXEL SUPER-RESOLUTION USING WAVELENGTH SCANNING

Pixel Super-Resolution Using Wavelength Scanning

 

SUMMARY

UCLA researchers have developed a novel way to significantly improve the resolution of an undersampled or pixelated image.

 

BACKGROUND

High-resolution imaging across a wide field-of-view (FOV) is essential for various applications in different fields. Current solutions either require imaging systems to large in size where higher magnification and bigger lenses are used, or image sensors that use smaller pixel pitch which have low signal to noise ratios. There is a need for a imaging system that can significantly improve image resolution from an undersampled image while having a small system size.

 

INNOVATION

UCLA researchers have developed a novel way to significantly improve the resolution of an undersampled or pixelated image. This new pixel super-resolution method functions without the use of any lateral shifts or displacements. The system also utilizes wavelength scanning.

 

APPLICATIONS

- Improving image resolution

- High-speed widefield imaging

- Field-portable microscopy

- Telemedicine applications

 

ADVANTAGES

- Uniform resolution improvement

- Requires fewer raw measurements while maintaining performance

- Smaller imaging system size/ more portable

- High signal to noise ratio Improved efficiency

 

RELATED MATERIALS

- Luo W, Greenbaum A, Zhang Y, Ozcan A. Synthetic aperture-based on-chip microscopy. Light: Science & Applications 2015; 4: e261.

- Greenbaum A, Luo W, Khademhosseinieh B, Su T-W, Coskun AF, Ozcan A. Increased space-bandwidth product in pixel super-resolved lensfree on-chip microscopy. Scientific Reports 2013; 3.

Patent Information:
For More Information:
Greg Markiewicz
Business Development Officer
greg.markiewicz@tdg.ucla.edu
Inventors:
Aydogan Ozcan
Wei Luo