SUMMARY:
UCLA researchers in the Department of Physics and Astronomy have developed a beam profile monitor capable of resolving ultra-small particle beams at sub-micron spot sizes.
BACKGROUND:
Modern optical applications utilizing ultra-high brightness beams, such as X-ray free electron lasers (XFEL), require monitoring the spatial distributions of the small beams (spot sizes in microns) for optimizing the performance. However, current beam diagnostic tools are unable to resolve spatial distribution of the small beams. Fundamentally, the use of optical light in the existing beam profile monitoring techniques sets the resolution limit. Therefore, there is a need for a better profile monitor that is capable of resolving the spatial distributions of the ultra-small particle beams with spot sizes in micron or sub-microns for improving the instrument performances.
INNOVATION:
UCLA researchers the use of in the Department of Physics and Astronomy have developed a novel beam profile monitor that is not based on the common technique of optical transition radiation (OTR). Instead, the UCLA device makes use of the target material’s properties. Tests have shown that the technology can accurately determine the spatial profile of ultra-small beams over many orders of magnitude of beam intensity in a single shot.
POTENTIAL APPLICATIONS:
ADVANTAGES:
DEVELOPMENT TO DATE:
Robust simulation has been completed.