Summary
UCLA Researchers in the Electrical Engineering Department and the Anesthesiology and Physiology Department have developed a novel method to significantly enhance the resolution of imaging instruments in all three spatial dimensions.
Background
Far-field optical microscopes, laser scanning confocal microscopes, and 4Pi confocal microscopes can image 3D structures. These microscopes are limited in resolution by the Abbe diffraction limit, especially in the axial z direction. Nonlinear techniques, such as stimulated emission depletion (STED), can break the diffraction limit. Combining STED with 4Pi microscopy has lead to resolution improvements, but this comes at the cost of great expense, alignment difficulty, and the need for multiple different ultrashort laser pulses that require precise temporal synchronization and spatial overlap.
Innovation
The novel method uses optical amplification to enhance the resolution of far-field imaging instruments, overcoming the Abbe diffraction limit. The method can be implemented on an existing microscope as an enhanced function. It works for fluorescence microscopes using CW lasers and does not require the use of expensive ultrafast pulsed lasers. Implementation costs are negligible compared to the cost of the microscope, enabling significant resolution enhancement at practically no additional cost overhead to the instruments. Further, the novel method is straightforward and does not require any complicated alignment, synchronization, or other implementation difficulties.
Applications
Advantages
State of Development
The technique has been reduced to practice and demonstrated in laboratory experimentation.