SUMMARY:
UCLA researchers in the Department of Electrical and Computer Engineering have developed a microcomb-based spectrally resolved interferometer (SRI) for precise dimension measurements.
BACKGROUND:
Physical length determination, a standard quantitative measurement, is currently achieved by the application of a laser interferometer. The application of optical approaches for length determinations can be applied in industrial fields for large-scale manufacturing and axis control of ultraprecision machines. In addition, they can be applied in space missions such as orbiting or satellite aperture imaging. Recently, the use of optical frequency combs has been playing key roles in laser-based dimension metrology due to its broad frequency range and bandwidth. However, instrumentation can be bulky and complicated, which increases challenges in applying this method for measurements of small objects or distances. Therefore, there is a need for the development of small devices that can be used for distance measurement including light detection and ranging (LIDAR) at both small and large scales.
INNOVATION:
UCLA researchers in the Department of Electrical and Computer Engineering have developed a soliton microcomb based spectrally resolved interferometer (SRI) for precise dimensional measurements. The small instrument allows the measurement of sub-20 nm precision and long-term operation over extended time frames to improve measurement reproducibility. The device not only operates in sub-nm precision but has a maximum measurable distance of 30 km. The soliton microcomb SRI device provides a realistic possibility to apply precision dimensional measurement at the chip-scale. The compact and mass-producible device is precise and could advance the fields of bio-imaging and industrial areas with chip-scale integrated systems.
POTENTIAL APPLICATIONS:
• Bio-imaging
• Microdevice measurements
• Optical imaging
• LIDAR
• Metrology
• Astronomy
• 3D surface imaging
ADVANTAGES:
• Microscale precision
• Small instrument
• Long-term operation
• Precise dimensional measurement
DEVELOPMENT TO DATE:
First successful demonstration of device.
RELATED PAPERS:
Y. S. Jang, H. Liu, J. Yang, M. Yu, D.-L. Kwong, and C. W. Wong, Nanometric precision distance metrology via hybrid spectrally-resolved and homodyne interferometry in a single soliton frequency microcomb, Phys. Rev. Lett. 126, 023903 (2021)
REFERENCE:
UCLA Case No. 2019-340
LEAD INVENTOR:
Chee Wei Wong