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2022-037 PROFILE MONITOR FOR ULTRA-SMALL PARTICLE BEAMS

SUMMARY: UCLA researchers in the Department of Physics and Astronomy have developed a beam profile monitor capable of resolving ultra-small particle beams at sub-micron spot sizes. BACKGROUND: Modern optical applications utilizing ultra-high brightness beams, such as X-ray free electron lasers (XFEL), require monitoring the spatial distributions...

Published: 7/19/2023 | Inventor(s): Nathan Majernik

Keywords(s): Beam Divergence, Instrumentation, Instrumentation & Analysis, Ion Beam, Laser, Nanotechnology, Optics, Photonics

Category(s): Electrical > Sensors, Materials > Nanotechnology, Optics & Photonics