Search Results - metrology

1 Results

Sort By:

Chip-Scale Frequency-Comb Assisted Coherent LIDAR With Sub-Micrometer Precision (UCLA Case No. 2019-340)

SUMMARY: UCLA researchers in the Department of Electrical and Computer Engineering have developed a microcomb-based spectrally resolved interferometer (SRI) for precise dimension measurements. BACKGROUND: Physical length determination, a standard quantitative measurement, is currently achieved by the application of a laser interferometer. The application...

Published: 2/16/2024 | Inventor(s): Chee Wei Wong, Yoon-Soo Jang, Hao Liu, Jinghui Yang

Keywords(s): Electronics & Semiconductors, Laser, Metrology, Network On A Chip, Photodetector, Photonics, Q Factor LIDAR, Semiconductor, Semiconductor Device, Semiconductors, System On A Chip

Category(s): Materials > Nanotechnology, Electrical, Electrical > Sensors, Optics & Photonics