Search Results - soft+error

1 Results

Sort By:

2021-400 COMET: On-Die and In-Controller Collaborative Memory ECC Technique for Stronger and Safer Correction of DRAM Errors

Summary: UCLA researchers in the Department of Electrical and Computer Engineering have developed a method titled Collaborative Memory ECC Technique (COMET), to efficiently detect two error correcting codes (ECC) and eliminate silent data corruption (SDC) when double-bit errors occur within DRAMs. Background: Technological abundance has been the...

Published: 12/11/2023 | Inventor(s): Puneet Gupta, Irina Alam

Keywords(s): Analogue Electronics, Big Data, Data Corruption, DDR3 SDRAM, DDR4 SDRAM, Random-Access Memory, Semiconductor, Semiconductor Device, Soft Error, Software

Category(s): Electrical, Electrical > Electronics & Semiconductors, Materials > Semiconducting Materials, Energy & Environment > Energy Storage