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Method for Reducing Process Variation-Induced Threshold Voltage Mismatch in FD-SOI
Transistors
(Case No. 2025-271)
Summary: UCLA researchers in the Department of Electrical and Computer Engineering have developed a transistor-level method that dynamically tunes device characteristics to eliminate mismatch, achieving higher stability and precision without added area or power costs. Background:
Transistors
are the fundamental semiconductor building blocks for amplification,...
Published: 10/23/2025
|
Inventor(s):
Subramanian Iyer
,
Siyun Qiao
,
Jacklyn Zhu
,
Samuel Wang
Keywords(s):
device stability
,
Electronics & Semiconductors
,
frequency modulation
,
Integrated Circuit
,
Integrated Circuit Via (Electronics)
,
Microelectronics Semiconductor Device Fabrication
,
Mixed-Signal Integrated Circuit
,
Semiconductor
,
Semiconductor Device
,
Semiconductor Device Fabrication
,
Semiconductors
,
Signal Processing
,
Silicon
,
Transistor
,
transistors
Category(s):
Electrical
,
Electrical > Signal Processing
,
Electrical > Instrumentation
,
Electrical > Electronics & Semiconductors
,
Software & Algorithms
,
Software & Algorithms > Communication & Networking
HFSIO as Gate Insulator for N-Polar Gan HEMTs (Case No. 2024-268)
Summary: Researchers in the UCLA Department of Electrical and Computer Engineering have developed a new, high-performance transistor for high-frequency and high-power systems. Background: Gallium nitride (GaN) high electron mobility
transistors
(HEMTs) are critical for high-frequency and high-power electrical applications due to their superior material...
Published: 6/12/2025
|
Inventor(s):
Elaheh Ahmadi
,
Oguz Odabasi
,
Xin Zhai
Keywords(s):
atomic layer deposition
,
dielectric gates
,
field-effect
transistors
(FETs)
,
gallium nitride
,
GaN
,
G-polar GAN
,
hafnium silicon oxide
,
HfSiO
,
high dielectric constant materials
,
high electron mobility
transistors
,
high electron mobility
transistors
(HEMTs)
,
high frequency electronics
,
high power electronics
,
N-polar GAN
,
organic field effect
transistors
,
quality control manufacturing
,
scalable manufacturing
,
solid-state thermal transistor
,
strength-thermal stability
,
thermal stability
,
thermal transistor
,
Thin-Film Transistor
,
Transistor
,
transistors
Category(s):
Chemical
,
Chemical > Chemical Processing & Manufacturing
,
Electrical
,
Electrical > Electronics & Semiconductors
,
Materials
,
Materials > Semiconducting Materials
,
Materials > Metals
Field-Effect Transistor Biosensors Integrated With Porous Media (Case No. 2023-093)
Summary: UCLA researchers in the Department of Electrical and Computer Engineering in collaboration with the University of Chicago have developed a new diagnostic biosensor by combining field-effect
transistors
with porous media. Background: Point-of-care (POC) and self-testing tools rely on the real-time monitoring of biomarkers in bodily fluids....
Published: 2/14/2025
|
Inventor(s):
Aydogan Ozcan
,
Hyouarm Joung
,
Hyun-June Jang
,
Junhong Chen
Keywords(s):
Biomarker
,
biomarkers
,
Biomaterial
,
Biosensor
,
Computer-Aided Diagnosis
,
Diagnostic Markers & Platforms
,
Diagnostic Platform Technologies (E.G. Microfluidics)
,
Diagnostic Test
,
Electrical
,
Electrical Engineering
,
electrically-mediated sensing
,
electrochemical sensors
,
enzyme functionalization
,
field-effect
transistors
(FETs)
,
Medical diagnostics
,
multiplexed analysis
,
Point Of Care
,
point-of-care
,
porous media
,
sample matrix effects
,
transistors
Category(s):
Electrical
,
Electrical > Sensors
,
Medical Devices
,
Medical Devices > Monitoring And Recording Systems
,
Diagnostic Markers
,
Diagnostic Markers > Targets And Assays
,
Platforms
,
Platforms > Diagnostic Platform Technologies