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Non-Destructive Probes for Known Good Die and Assembly Testing (Case No. 2026-073)
Summary: UCLA researchers in the Department of Electrical and Computer Engineering have developed a liquid-metal-based, nondestructive probing platform for high-density semiconductor die and assembly testing. Background: As semiconductor devices become smaller and more complex, manufacturers face growing challenges in testing chips before they are...
Published: 3/2/2026
|
Inventor(s):
Subramanian Iyer
,
Samuel Wang
Keywords(s):
biocompatible
,
Chipset
,
dielet assembly
,
Electrical
,
Electrical Engineering
,
Electronic Packaging
,
electronics packaging
,
high throughput testing
,
Liquid metal particles
,
liquid metals
,
low-cost fabrication
,
MEMS
,
micro-electromechanical systems (MEMS)
,
Microelectronics Semiconductor Device Fabrication
,
scalable fabrication
,
Semiconductor
,
Semiconductor Device Fabrication
,
Semiconductors
,
soft electrical circuits
,
wafer-scale
Category(s):
Electrical
,
Electrical > Electronics & Semiconductors
,
Materials
,
Materials > Fabrication Technologies
,
Materials > Semiconducting Materials
,
Mechanical > Manufacturing
,
Mechanical > Micro-Electromechanical Systems (Mems)
Method for Reducing Process Variation-Induced Threshold Voltage Mismatch in FD-SOI Transistors (Case No. 2025-271)
Summary: UCLA researchers in the Department of Electrical and Computer Engineering have developed a transistor-level method that dynamically tunes device characteristics to eliminate mismatch, achieving higher stability and precision without added area or power costs. Background: Transistors are the fundamental semiconductor building blocks for amplification,...
Published: 10/23/2025
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Inventor(s):
Subramanian Iyer
,
Siyun Qiao
,
Jacklyn Zhu
,
Samuel Wang
Keywords(s):
device stability
,
Electronics & Semiconductors
,
frequency modulation
,
Integrated Circuit
,
Integrated Circuit Via (Electronics)
,
Microelectronics Semiconductor Device Fabrication
,
Mixed-Signal Integrated Circuit
,
Semiconductor
,
Semiconductor Device
,
Semiconductor Device Fabrication
,
Semiconductors
,
Signal Processing
,
Silicon
,
Transistor
,
transistors
Category(s):
Electrical
,
Electrical > Signal Processing
,
Electrical > Instrumentation
,
Electrical > Electronics & Semiconductors
,
Software & Algorithms
,
Software & Algorithms > Communication & Networking