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A High Throughput Thermal Compression Bonding Scheme for Interposer and Wafer-Scale Advanced Packaging Constructs (Case No. 2023-144)
Summary: UCLA researchers in the Department of Electrical and Computer and Engineering have introduced a scalable and rapid bonding method for dielet assembly on advanced packaging constructs, achieving a remarkable throughput of over 1100 units-per-hour, or 10-fold higher than the conventional assembly method. Background: In semiconductor packaging,...
Published: 7/9/2024
|
Inventor(s):
Subramanian Iyer
,
Krutikesh Sahoo
,
Haoxiang Ren
Keywords(s):
advanced packaging
,
advanced packaging constructs
,
dielet assembly
,
dielet bonding
,
Electronic Packaging
,
electronics packaging
,
Fabrication Technologies
,
face-to-face heterogeneous dielet bonding
,
heterogeneous integration
,
heterogenous electronic systems
,
high throughput
,
Instrumentation
,
Interposers
,
Microelectronics Semiconductor Device Fabrication
,
Organic Semiconductor
,
package scaling
,
Semiconductor
,
semiconductor chip foundries
,
Semiconductor Device
,
Semiconductor Device Fabrication
,
Semiconductors
,
thermal compression bonding
,
wafer-scale
,
wafer-scale computing
,
Waferscale Processors
Category(s):
Electrical
,
Electrical > Electronics & Semiconductors
,
Electrical > Electronics & Semiconductors > Waferscale Computing
,
Materials
,
Materials > Semiconducting Materials
,
Materials > Fabrication Technologies
,
Electrical > Instrumentation
2022-241 A TSV-Less Architecture for Power Delivery and I/O for Interposers and Other Advanced Packaging Constructs
Summary: UCLA researchers led by Professor Iyer have developed a wafer-scale processor manufacturing method that does not require standard through-silicon vias (TSVs). Background: With the rise of machine learning applications, demand for devices capable of high-performance computing (HPC) has also increased. Popularity and demand for wafer-scale...
Published: 7/19/2023
|
Inventor(s):
Subramanian Iyer
,
Haoxiang Ren
,
Saptadeep Pal
Keywords(s):
Amorphous Silicon
,
Artifical Intelligence (Machine Learning, Data Mining)
,
Artificial Intelligence
,
Artificial Neural Network
,
Bandwidth (Signal Processing)
,
Brain-Computer Interface
,
Brain-Computer Interface Body Mass Index
,
Chipset
,
Clock Signal
,
Computer Aided Design & Manufacturing
,
Computer Aided Learning
,
Computer Architecture
,
Computer Monitor
,
Computer Security
,
Computer Virus
,
Computer Vision
,
Computer-Aided Design
,
Computer-Aided Diagnosis
,
Continuum Mechanics Computer Graphics Collision Detection
,
Digital Signal Processing
,
Doping (Semiconductor)
,
Electrical
,
Electrical Engineering
,
Electrical Impedance
,
Electrical Load
,
Electrical Resistance And Conductance
,
Electrical Resistivity And Conductivity
,
Electronics & Semiconductors
,
Graphics Processing Unit
,
Graphics Processing Unit Analog Computer
,
Human-Computer Interaction
,
Machine Learning
,
Machine Vision
,
Manufacturing
,
Microelectronics Semiconductor Device Fabrication
,
Microprocessor
,
Network Analysis (Electrical Circuits)
,
Network On A Chip
,
Organic Semiconductor
,
Quantum Computer
,
Semiconductor
,
Semiconductor Device
,
Semiconductor Device Fabrication
,
Semiconductor Ohmic Contact
,
Semiconductor Risk Assessment
,
Semiconductor Sapphire
,
Semiconductors
,
Signal Processing
,
Silicon
,
Silicon Dioxide
,
Silicon Working Electrode Perovskite (Structure)
,
Silicon-Germanium
,
Supercomputer
,
System On A Chip
,
Tablet Computer
Category(s):
Electrical
,
Electrical > Electronics & Semiconductors
,
Electrical > Signal Processing
,
Materials > Semiconducting Materials
,
Electrical > Electronics & Semiconductors > Circuits
,
Software & Algorithms > Artificial Intelligence & Machine Learning